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DeCS
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Descriptor English:
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Microscopy, Atomic Force
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Descriptor Spanish:
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Microscopía de Fuerza Atómica
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Descriptor Portuguese:
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Microscopia de Força Atômica
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Synonyms English:
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Atomic Force Microscopy
Force Microscopy
Scanning Force Microscopy
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Tree Number:
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E01.370.350.515.666.400
E05.595.666.400
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Definition English:
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A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample. |
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See Related English:
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Microscopy, Scanning Tunneling
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History Note English:
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95
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Allowable Qualifiers English:
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Record Number:
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32147
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Unique Identifier:
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D018625
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Occurrence in VHL:
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Similar:
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DeCS CID-10 SciELO LILACS LIS
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